DocumentCode
1754608
Title
Experimental characterisations of thin film transmission line losses
Author
Kim, Dongkyu ; Kim, Heonhwan ; Eo, Y.
Author_Institution
Dept. of Electron. & Commun. Eng., Hanyang Univ., Ansan, South Korea
Volume
49
Issue
17
fYear
2013
fDate
August 15 2013
Firstpage
1084
Lastpage
1086
Abstract
New frequency-variant losses of planar thin film transmission lines are experimentally investigated in a broad frequency range. The frequency-variant transmission line parameters are accurately determined in the measured frequency band (i.e. from 40 MHz to 50 GHz). Then, it is shown that there are three critical frequencies that characterise the loss mechanism of thin film transmission lines. The conventional skin-effect model is not accurate in thin and fine transmission lines.
Keywords
losses; thin film devices; transmission lines; bandwidth 40 MHz to 50 GHz; experimental characterisations; frequency band measurement; frequency range; frequency-variant losses; frequency-variant transmission line parameters; loss mechanism characterization; planar thin film transmission lines;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2013.1444
Filename
6583120
Link To Document