• DocumentCode
    1754745
  • Title

    Access Time and Power Dissipation of a Model 256-Bit Single Flux Quantum RAM

  • Author

    Ortlepp, Thomas ; Van Duzer, Theodore

  • Author_Institution
    CiS Res. Inst. for Microsensor Syst., Photovoltaics GmbH, Erfurt, Germany
  • Volume
    24
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Superconductor electronics offers logic circuits for high-speed data processing and high-performance computing. The main barrier to practical application is the lack of high-speed and low-power memory. It is widely believed that the most reliable and functional bit cell for superconducting memory is the vortex transitional bit cell, which was successfully used by Nagasawa in a 4-kb memory. This paper reviews existing challenges in this type of Josephson memory devices and discusses engineering issues in implementing a model single flux quantum random access memory. We evaluate the contributions that various components of the memory system make to delay and power dissipation. The 256-bit memory provides an experimentally confirmed read access time of 190 ps. As a result, we found that delay and power dissipation are found largely in the address decoder, line drivers, bit-selection scheme, and the data readout circuitry. With these circuits being similar for various magnetic memory devices, our findings provide essential data for a comprehensive assessment of new concepts for bit cells, readout, and write in superconducting memories.
  • Keywords
    superconducting memory circuits; Josephson memory devices; address decoder; bit-selection scheme; data readout circuitry; functional bit cell; high-performance computing; high-speed data processing; line drivers; logic circuits; memory system; model 256-bit single flux quantum RAM; model single flux quantum random access memory; power dissipation; read access time; superconducting memory; superconductor electronics; vortex transitional bit cell; Computer architecture; Decoding; Delays; Logic gates; Microprocessors; Power demand; Random access memory; Josephson junction; random access memory (RAM); superconducting electronics;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2014.2318309
  • Filename
    6803912