Title :
Access Time and Power Dissipation of a Model 256-Bit Single Flux Quantum RAM
Author :
Ortlepp, Thomas ; Van Duzer, Theodore
Author_Institution :
CiS Res. Inst. for Microsensor Syst., Photovoltaics GmbH, Erfurt, Germany
Abstract :
Superconductor electronics offers logic circuits for high-speed data processing and high-performance computing. The main barrier to practical application is the lack of high-speed and low-power memory. It is widely believed that the most reliable and functional bit cell for superconducting memory is the vortex transitional bit cell, which was successfully used by Nagasawa in a 4-kb memory. This paper reviews existing challenges in this type of Josephson memory devices and discusses engineering issues in implementing a model single flux quantum random access memory. We evaluate the contributions that various components of the memory system make to delay and power dissipation. The 256-bit memory provides an experimentally confirmed read access time of 190 ps. As a result, we found that delay and power dissipation are found largely in the address decoder, line drivers, bit-selection scheme, and the data readout circuitry. With these circuits being similar for various magnetic memory devices, our findings provide essential data for a comprehensive assessment of new concepts for bit cells, readout, and write in superconducting memories.
Keywords :
superconducting memory circuits; Josephson memory devices; address decoder; bit-selection scheme; data readout circuitry; functional bit cell; high-performance computing; high-speed data processing; line drivers; logic circuits; memory system; model 256-bit single flux quantum RAM; model single flux quantum random access memory; power dissipation; read access time; superconducting memory; superconductor electronics; vortex transitional bit cell; Computer architecture; Decoding; Delays; Logic gates; Microprocessors; Power demand; Random access memory; Josephson junction; random access memory (RAM); superconducting electronics;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2318309