Title :
InGaAs/GaAs Multiple-Quantum-Well Semiconductor Disk Laser Pumped With Electron Beam
Author :
Kozlovsky, Vladimir I. ; Okhotnikov, Oleg G. ; Popov, Yuri M.
Author_Institution :
P.N. Lebedev Phys. Inst., Moscow, Russia
Abstract :
We report an electron-beam-pumped vertical-external-cavity surface-emitting laser [or semiconductor disk laser (SDL)] on the basis of InGaAs/GaAs multiple-quantum-well structure grown monolithically by molecular-beam epitaxy together with high-reflective AlGaAs/GaAs distributed Bragg reflector. The auxiliary mirror of the optical cavity is spherical with 20- or 30-mm radius of curvature and a transparency of 1.5%. The SDL is operated in a pulse mode at the room temperature and in a continuous wave (CW) mode at the temperature of liquid nitrogen. A pulse peak power of 9 W is achieved at wavelength of λ = 1035 nm under pumping by electrons with energy of 42 keV. The full-width at half-maximum pulse duration is 150-320 ns. Maximum laser efficiency of about 15% is achieved at the electron energy of 22-23 keV. The full-beam divergence is below 10 mrad. At the CW mode, we obtained 23 mW of average output power near the wavelength λ = 1026 nm.
Keywords :
III-V semiconductors; distributed Bragg reflector lasers; electron beams; gallium arsenide; indium compounds; laser mirrors; molecular beam epitaxial growth; optical pumping; quantum well lasers; surface emitting lasers; InGaAs-GaAs; auxiliary mirror; distributed Bragg reflector; electron beams; electron volt energy 22 keV to 23 keV; electron volt energy 42 keV; molecular beam epitaxy; multiple quantum well semiconductor disk laser; optical pumping; power 23 mW; power 9 W; size 20 mm; size 30 mm; temperature 293 K to 298 K; vertical external cavity surface emitting laser; wavelength 1026 nm; wavelength 1035 nm; Cavity resonators; Laser beams; Laser excitation; Laser modes; Mirrors; Pump lasers; E-beam pumping; multiple-quantum-well structures; semiconductor disk lasers; vertical–external-cavity surface-emitting lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2012.2232284