Abstract :
This is my first column on the "Future Trends in I&M," and let me thank you, first of all, for your patience in reading the column and the editor-in-chief of this magazine, Dr. Wendy van Moer, for giving me this opportunity. When she first contacted me and asked me to contribute to the Instrumentation and Measurement Magazine on a regular basis, I was amazingly surprised and asked her why she selected me for a column that requires an insight into the I&M field that I do not feel I have. Wendy\´s answer was even more surprising than the original proposal. She selected me because I\´m one of the recipients of the IEEE Instrumentation and Measurement Society Outstanding Young Engineer Award, and as such, I should be, in her opinion, young and brilliant.
