DocumentCode :
1755143
Title :
Experimental Validation of a Two-Phase Clock Scheme for Fine-Grained Pipelined Circuits Based on Monostable to Bistable Logic Elements
Author :
Nunez, Juan ; Avedillo, Maria J. ; Quintana, Jose M.
Author_Institution :
Inst. de Microelectron. de Sevilla, Univ. of Sevilla, Sevilla, Spain
Volume :
22
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
2238
Lastpage :
2242
Abstract :
Research on fine-grained pipelines can be a way to obtain high-performance applications. Monostable to bistable (MOBILE) gates are very suitable for implementing gate-level pipelines, which can be achieved without resorting to memory elements. The MOBILE operating principle is implemented operating two series connected negative differential resistance devices with a clock bias. This brief describes and experimentally validates a two-phase clock scheme for such MOBILE-based ultragrained pipelines. Its advantages over other reported interconnection schemes for MOBILE gates, and also over pure CMOS two-phase counterparts, are stated and analyzed. Chains of MOBILE gates have been fabricated and the experimental results of their correct operation with a two-phase clock scheme are provided. As far as we know, this is the first working MOBILE circuit to have been reported with this interconnection architecture.
Keywords :
CMOS logic circuits; clocks; pipeline processing; MOBILE gates; MOBILE-based ultragrained pipelines; clock bias; fine-grained pipelined circuits; gate-level pipelines; interconnection architecture; interconnection schemes; monostable to bistable logic elements; series connected negative differential resistance devices; two-phase CMOS process; two-phase clock scheme; Clocks; Inverters; Logic gates; Mobile communication; Pipeline processing; Pipelines; Transistors; Clock schemes; monostable-to-bistable (MOBILE) logic element; negative differential resistance (NDR); pipeline; pipeline.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2013.2283306
Filename :
6731593
Link To Document :
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