DocumentCode
1755152
Title
Low-Cost Control Flow Protection via Available Redundancies in the Microprocessor Pipeline
Author
Rouf, Mohammad Abdur ; Soontae Kim
Author_Institution
Dept. of Inf. & Commun. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume
23
Issue
1
fYear
2015
fDate
Jan. 2015
Firstpage
131
Lastpage
141
Abstract
Miniaturization of very large scale integration circuits, higher frequencies and reduction of supply voltages make embedded systems more susceptible to soft errors (or transient errors). Soft errors affect the processor´s pipeline and hence its data and control flows. Specifically, errors in control flows can change program´s execution sequence, which might be catastrophic for safety-critical applications. Several state-of-the-art techniques are available for control flow error checking (CFEC). Software-based techniques suffer from increased code size overhead and can have a negative impact on energy consumption. On the other hand, hardware-based schemes incur high hardware and area costs. In this paper, a low-cost CFEC scheme is proposed that exploits available redundancies in the processor´s pipeline; a branch target buffer stores the target addresses of taken branches, a short backward branch detector stores short loop branch targets and an arithmetic logic unit generates branch target addresses using the low-order branch displacement bits of branch instructions. The proposed CFEC scheme uses these redundancies to detect and recover from control flow errors in the pipeline with low energy overhead of 0.9% and performance overhead of 0.8%, while its error coverage ranges from 86% to 99%.
Keywords
VLSI; buffer circuits; embedded systems; integrated circuit design; microprocessor chips; radiation hardening (electronics); CFEC scheme; arithmetic logic unit; backward branch detector; branch displacement bits; branch target buffer; control flow error checking; control flow protection; embedded systems; energy consumption; microprocessor pipeline; soft errors; software-based techniques; supply voltages; transient errors; very large scale integration circuits; Detectors; Embedded systems; Hardware; Pipelines; Process control; Redundancy; Registers; Branch target buffer (BTB); control flow errors; embedded systems; low power; reliability; short backward branch (SBB); soft errors; soft errors.;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2013.2297573
Filename
6731594
Link To Document