Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network

Author

Jingook Kim ; Jongjoo Lee ; Seungyoung Ahn ; Jun Fan

Author_Institution

Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea

Volume

56

Issue

6

fYear

2014

fDate

Dec. 2014

Firstpage

1585

Lastpage

1597

Abstract

A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB.

Keywords

integrated circuit design; integrated circuit noise; printed circuit interconnections; IC switching currents; PCB; PDN design methodology; SPICE simulation; burst train; closed form expressions; handheld device; integrated circuit; noise voltage; power distribution network; voltage drop; Capacitors; Closed-form solutions; Impedance; Integrated circuit modeling; Noise measurement; Switches; Burst noise; burst pattern; overshoot; power distribution network (PDN); switching current; target impedance; transient noise;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2014.2315837

Filename

6803982