Title :
Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network
Author :
Jingook Kim ; Jongjoo Lee ; Seungyoung Ahn ; Jun Fan
Author_Institution :
Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea
Abstract :
A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB.
Keywords :
integrated circuit design; integrated circuit noise; printed circuit interconnections; IC switching currents; PCB; PDN design methodology; SPICE simulation; burst train; closed form expressions; handheld device; integrated circuit; noise voltage; power distribution network; voltage drop; Capacitors; Closed-form solutions; Impedance; Integrated circuit modeling; Noise measurement; Switches; Burst noise; burst pattern; overshoot; power distribution network (PDN); switching current; target impedance; transient noise;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2014.2315837
