DocumentCode
1755423
Title
Detection of
Thin Layer by Using a Metallic Mesh Sensor
Author
Suzuki, Takumi ; Kondo, Toshiaki ; Ogawa, Y. ; Kamba, S. ; Kondo, N.
Author_Institution
Grad. Sch. of Agric., Kyoto Univ., Kyoto, Japan
Volume
13
Issue
12
fYear
2013
fDate
Dec. 2013
Firstpage
4972
Lastpage
4976
Abstract
The effectiveness of metallic mesh sensors to quantitatively measure thickness was evaluated by transmission spectra of sub- μm-thick SiO2 layers deposited on a 6-μm-thick metallic mesh. Initially, we simulated the transmission spectra and the localized electric field distribution of different-sized periodic structures using the finite difference time domain method. Both the wavelength of the resonance peak and the decay distance of the localized electric field changed linearly with the size of the geometric parameters of the metallic meshes. These electro-magnetic properties enabled smaller-sized periodic structures to acquire exponentially higher sensitivity for the thin dielectric layer. The experiment resulted in distinct and systematic frequency shifts over 100-nm-thick SiO2 (101 GHz of shift and 61% of CV). Potential of the metallic meshes as label-free and frequency-flexible biosensors was performed, which have high sensitivity for thin target using small size of periodic structures.
Keywords
biosensors; dielectric thin films; finite difference time-domain analysis; silicon compounds; thickness measurement; SiO2; SiO2 thin layer detection; different-sized periodic structures; finite difference time domain method; frequency-flexible biosensors potential; localized electric field distribution; metallic mesh sensor; metallic meshes; size 100 nm; size 6 mum; thickness measurement; transmission spectra; Educational institutions; Electric fields; Optical sensors; Optical surface waves; Periodic structures; Sensitivity; Thickness measurement; Electromagnetic fields; metallic mesh sensor; optical sensor; periodic structure; thickness measurement;
fLanguage
English
Journal_Title
Sensors Journal, IEEE
Publisher
ieee
ISSN
1530-437X
Type
jour
DOI
10.1109/JSEN.2013.2278760
Filename
6583231
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