Title :
An Improved Analytical Model for Fast Evaluating Absorbing Material Properties for 220-GHz FW BWO
Author :
Jinchi Cai ; Linlin Hu ; Wenqiang Lei ; Huaibi Chen ; Xiao Jin ; Huanbi Chen
Author_Institution :
Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
Abstract :
Y-band devices, including folded waveguide, backward-wave oscillator, and traveling wave tube, are to be developed in our group, which use absorbing material in its attenuator to suppress self-oscillation or match the boundary conditions. This paper describes a developed analytical model of a rectangular waveguide system based on the voltage scattering matrix analysis to fast calculate the relative permittivity and electric loss angle tangent of a ceramic sample in consideration of waveguide wall loss. Compared to the high-quality factor cavity method and quasi-optical cavity method, this transmission/reflection measuring method in consideration of ohmic loss is of low cost and more convenient to obtain the material properties in a large-frequency range, by sacrificing some accuracy. 3-D numerical model is established to verify our method. The result shows that our method is accessible to give a fast message of material properties in a certain frequency range. The error analysis of this equivalent method is also discussed in this paper, which shows that this method is too error sensitive to be a practical tool in consideration of the controllable machining and assembly errors. Then, a simplified method is proposed to make the calculation result less sensitive to the parameter errors. The evaluation shows that the relative measuring error of the attenuating material to be tested can be confined to 25% around the frequency of 220 GHz. In advantage of its configuration, the absorber with this material to be used guarantees the small reflection ratio when the value of permittivity and loss tangent of the attenuating material varied by 25%.
Keywords :
S-matrix theory; backward wave oscillators; error analysis; rectangular waveguides; travelling wave tubes; 3D numerical model; FW BWO; Y-band devices; analytical model; assembly errors; backward-wave oscillator; boundary conditions; controllable machining; electric loss angle tangent; error analysis; factor cavity method; fast evaluating absorbing material properties; folded waveguide; frequency 220 GHz; ohmic loss; quasi-optical cavity method; rectangular waveguide system; reflection measuring method; reflection ratio; relative permittivity; self-oscillation suppression; transmission measuring method; traveling wave tube; voltage scattering matrix analysis; waveguide wall loss; Ceramics; Material properties; Numerical models; Permittivity; Rectangular waveguides; Scattering parameters; Absorber; dielectric material; lossy wall effect; material constant; terahertz; terahertz.;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2015.2406731