DocumentCode :
1755667
Title :
A 3.6-mW 50-MHz PN Code Acquisition Filter via Statistical Error Compensation in 180-nm CMOS
Author :
Kim, Eric P. ; Baker, Daniel J. ; Narayanan, Sriram ; Shanbhag, Naresh R. ; Jones, Douglas L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Volume :
23
Issue :
3
fYear :
2015
fDate :
42064
Firstpage :
598
Lastpage :
602
Abstract :
In this brief, we present a novel architecture for pseudorandom (PN) code acquisition based on statistical error compensation (SEC), which achieves significant power savings. SEC treats errors in hardware as noise in communication networks, and employs robust estimation theory to compensate for errors. We apply SEC to a 256-tap PN code acquisition filter in a 180-nm CMOS process. Multiple (five) dies were tested under voltage overscaling to achieve a near constant detection probability (Pdet) above 90%. The minimum energy consumption ranged from 72.89 to 210.59 pJ (ave 122.52 pJ) for supply voltages between 0.69 and 0.70 V. These operating conditions result in raw error rates of 85.83%-91.23% (ave 88.99%). Energy savings over a conventional errorfree design ranges from 2.4× to 5.8× (ave 3.86×). Energy savings over past work ranges from 1.55× to 3.79× (ave 2.52×). Improvement in error-tolerance over existing error-tolerant designs range from 2146× to 2281× (ave 2225×). The large energy savings were found to be due to a combination of voltage scaling and activity factor reduction. The proposed design achieves a 2.5× improvement in the figure of merit [normalized power/(#taps * precision * sample rate)] compared with conventional PN code acquisition filters.
Keywords :
CMOS integrated circuits; error compensation; filtering theory; pseudonoise codes; statistical analysis; CMOS process; PN code acquisition filter; SEC; activity factor reduction; energy 72.89 pJ to 210.59 pJ; energy savings; error-tolerance improvement; figure of merit; frequency 50 MHz; multiple dies; power 3.6 mW; power savings; pseudorandom code acquisition; robust estimation theory; size 180 nm; statistical error compensation; voltage 0.69 V to 0.70 V; voltage overscaling; Clocks; Computer architecture; Error compensation; Robustness; Sensors; Timing; Very large scale integration; Error tolerance; low power; pseudorandom (PN) code acquisition; statistical error compensation (SEC); voltage overscaling (VOS); voltage overscaling (VOS).;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2014.2311318
Filename :
6804020
Link To Document :
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