Title :
FPGA-Based Bit Error Rate Performance Measurement of Wireless Systems
Author :
Alimohammad, Amirhossein ; Fard, Saeed Fouladi
Author_Institution :
Dept. of Electr. & Comput. Eng., San Diego State Univ., San Diego, CA, USA
Abstract :
This paper presents the bit error rate (BER) performance validation of digital baseband communication systems on a field-programmable gate array (FPGA). The proposed BER tester (BERT) integrates fundamental baseband signal processing modules of a typical wireless communication system along with a realistic fading channel simulator and an accurate Gaussian noise generator onto a single FPGA to provide an accelerated and repeatable test environment in a laboratory setting. Using a developed graphical user interface, the error rate performance of single- and multiple-antenna systems over a wide range of parameters can be rapidly evaluated. The FPGA-based BERT should reduce the need for time-consuming software-based simulations, hence increasing the productivity. This FPGA-based solution is significantly more cost effective than conventional performance measurements made using expensive commercially available test equipment and channel simulators.
Keywords :
Gaussian noise; antennas; digital communication; error statistics; fading channels; field programmable gate arrays; graphical user interfaces; signal detection; signal processing; BER performance validation; FPGA-based BERT; FPGA-based bit error rate performance measurement; FPGA-based solution; Gaussian noise generator; baseband signal processing modules; channel simulators; digital baseband communication systems; fading channel simulator; field-programmable gate array; graphical user interface; laboratory setting; multiple-antenna systems; single-antenna systems; test environment; test equipment; time-consuming software-based simulations; wireless communication system; Baseband; Bit error rate; Correlation; Fading; Generators; MIMO; Baseband performance validation; Gaussian noise generator (GNG); Golay code; bit-error rate tester (BERT); fading channel simulation; field-programmable gate array (FPGA); maximum likelihood (ML); maximum likelihood (ML).;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2013.2276010