• DocumentCode
    1755754
  • Title

    FPGA-Based Bit Error Rate Performance Measurement of Wireless Systems

  • Author

    Alimohammad, Amirhossein ; Fard, Saeed Fouladi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., San Diego State Univ., San Diego, CA, USA
  • Volume
    22
  • Issue
    7
  • fYear
    2014
  • fDate
    41821
  • Firstpage
    1583
  • Lastpage
    1592
  • Abstract
    This paper presents the bit error rate (BER) performance validation of digital baseband communication systems on a field-programmable gate array (FPGA). The proposed BER tester (BERT) integrates fundamental baseband signal processing modules of a typical wireless communication system along with a realistic fading channel simulator and an accurate Gaussian noise generator onto a single FPGA to provide an accelerated and repeatable test environment in a laboratory setting. Using a developed graphical user interface, the error rate performance of single- and multiple-antenna systems over a wide range of parameters can be rapidly evaluated. The FPGA-based BERT should reduce the need for time-consuming software-based simulations, hence increasing the productivity. This FPGA-based solution is significantly more cost effective than conventional performance measurements made using expensive commercially available test equipment and channel simulators.
  • Keywords
    Gaussian noise; antennas; digital communication; error statistics; fading channels; field programmable gate arrays; graphical user interfaces; signal detection; signal processing; BER performance validation; FPGA-based BERT; FPGA-based bit error rate performance measurement; FPGA-based solution; Gaussian noise generator; baseband signal processing modules; channel simulators; digital baseband communication systems; fading channel simulator; field-programmable gate array; graphical user interface; laboratory setting; multiple-antenna systems; single-antenna systems; test environment; test equipment; time-consuming software-based simulations; wireless communication system; Baseband; Bit error rate; Correlation; Fading; Generators; MIMO; Baseband performance validation; Gaussian noise generator (GNG); Golay code; bit-error rate tester (BERT); fading channel simulation; field-programmable gate array (FPGA); maximum likelihood (ML); maximum likelihood (ML).;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2013.2276010
  • Filename
    6583269