DocumentCode
1756291
Title
Entrainment of Micromechanical Limit Cycle Oscillators in the Presence of Frequency Instability
Author
Blocher, David B. ; Zehnder, Alan T. ; Rand, Richard H.
Author_Institution
Dept. of Mech. & Aerosp. Eng., Cornell Univ., Ithaca, NY, USA
Volume
22
Issue
4
fYear
2013
fDate
Aug. 2013
Firstpage
835
Lastpage
845
Abstract
The nonlinear dynamics of micromechanical oscillators are explored experimentally. Devices consist of singly and doubly supported Si beams, 200 nm thick and 35 μm long. When illuminated within a laser interference field, devices self-oscillate in their first bending mode due to feedback between laser heating and device displacement. Compressive prestress buckles doubly supported beams leading to a strong amplitude-frequency relationship. Significant frequency instability is seen in doubly supported devices. Self-resonant beams are also driven inertially with varying drive amplitude and frequency. Regions of primary, sub-, and superharmonic entrainment are measured. Statistics of primary entrainment are measured for low drive amplitudes, where the effects of frequency instability are measurable. Sub- and superharmonic entrainment are not seen in singly supported beams. A simple model is built to explain why high-order entrainment is seen only in doubly supported beams. Its analysis suggests that the strong amplitude-frequency relationship in doubly supported beams enables hysteresis, wide regions of primary entrainment, and high orders of sub- and superharmonic entrainment.
Keywords
elemental semiconductors; laser beams; laser frequency stability; light interference; micro-optics; micromechanical devices; oscillators; silicon; Si; amplitude-frequency relationship; bending mode; compressive prestress; device displacement; doubly supported beams; doubly supported devices; drive amplitude; frequency instability; high-order entrainment; laser heating; laser interference field; micromechanical limit cycle oscillators; nonlinear dynamics; self-resonant beams; size 200 nm; size 35 mum; superharmonic entrainment; Frequency measurement; Laser beams; Limit-cycles; Measurement by laser beam; Oscillators; Power lasers; Resonant frequency; Limit cycles; micromechanical devices; optical resonators; oscillators; thermomechanical processes;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2013.2248124
Filename
6478863
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