DocumentCode
1756606
Title
Fabrication and Characterization of a Novel Nanoscale Thermal Anemometry Probe
Author
Vallikivi, Margit ; Smits, Alexander J.
Author_Institution
Dept. of Mech. & Aerosp. Eng., Princeton Univ., Princeton, NJ, USA
Volume
23
Issue
4
fYear
2014
fDate
Aug. 2014
Firstpage
899
Lastpage
907
Abstract
The development, fabrication, and characterization of a novel nanoscale thermal anemometry probe (NSTAP) for measuring velocity fluctuations in turbulent flows are described. This miniature MEMS anemometer consists of a freestanding 30 or 60 × 1 × 0.1 μm platinum filament with electrically conductive pads and a silicon structure. A novel deep reactive ion etching lag-based process for fabricating a 3D silicon support structure is described together with other microfabrication steps. The sensors behave similarly to conventional hotwire anemometers, with an order of magnitude better spatial and temporal resolution. Batch fabrication allows a relatively low-cost high-yield process, which together with its superior frequency response and size, make it an attractive thermal anemometry sensor for velocity measurements in turbulent flows.
Keywords
anemometry; electrical conductivity; elemental semiconductors; flow measurement; flow sensors; frequency response; microfabrication; microsensors; nanosensors; platinum; silicon; sputter etching; temperature measurement; turbulence; velocity measurement; 3D silicon support structure fabrication; batch fabrication; deep reactive ion etching lag-based process; electrically conductive pads; frequency response; hot wire anemometer; microfabrication; miniature MEMS anemometer; nanoscale thermal anemometry probe; platinum filament; spatial resolution; temporal resolution; thermal anemometry sensor; turbulent flow; velocity fluctuation measurment; Fabrication; Metals; Probes; Sensor phenomena and characterization; Silicon; Wires; Microelectromechanical devices; anemometers; velocity measurement; velocity measurement.;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2014.2299276
Filename
6732906
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