DocumentCode :
1756870
Title :
Modeling of the Critical-Current Behavior of  \\hbox {Nb}_{3}\\hbox {Sn} Subsized Cables Under Transverse Load Using 2D Finite Element Analysis and a Strain Scaling Law
Author :
Wang, Tao ; Chiesa, Luisa ; Takayasu, Makoto ; Bordini, B.
Author_Institution :
Dept. of Mech. Eng., Tufts Univ., Medford, MA, USA
Volume :
24
Issue :
3
fYear :
2014
fDate :
41791
Firstpage :
1
Lastpage :
4
Abstract :
The mechanisms causing the critical-current degradation of ITER-type Nb3Sn Cable-in-Conduit-Conductors have been studied in the past decade. One of the origins of the degradation of the performance is the Lorentz load during magnet operations. The strands within the cable subjected to the transverse loads locally experience larger strains than the ones caused by tensile loads. Results obtained with experiments on full size cables are limited due to their cost and difficulty so, to predict the degradations of a Nb3Sn CICC under transverse loads, empirical laws should be established. Strain scaling laws are available but have never been used to determine the behavior of strands under transverse load. We propose a new method, by which the critical-current behavior of a subsized cable under transverse loads is derived from the critical-current behavior under uni-axial strains. This method is based on the strain state of the Nb3Sn filaments obtained by finite element analysis (FEA). The FEA strain results are used to find the critical-current using tensile scaling laws available. The critical-current behavior obtained by this method is compared with the available experimental data of triplets. The results of this new methodology, its benefits, and limitations are discussed.
Keywords :
critical currents; finite element analysis; niobium compounds; superconducting cables; 2D finite element analysis; CICC; Lorentz load; Nb3Sn; cable-in-conduit-conductors; critical current behavior; critical current degradation; strain scaling law; subsized cables; tensile loads; tensile scaling; transverse load; uniaxial strains; Copper; Critical current density (superconductivity); Degradation; Finite element analysis; Material properties; Niobium-tin; Strain; $hbox{Nb}_{3}hbox{Sn}$ ; FEA; scaling law; transverse load;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2013.2290692
Filename :
6662450
Link To Document :
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