Epitaxial thin films of electron-doped infinite-layer (IL) cuprate superconductor Sr
1-xLa
xCuO
2 (SLCO,
) were grown by dc magnetron sputtering, and their structural and electrical properties were investigated systematically by changing the reduction annealing period under vacuum to remove excess apical-oxygen and the SLCO film thickness. Thin films of Ba
ySr
1-yTiO
3 with
, 0.55, and 0.7, prepared on (001) (La
0.18Sr
0.82)(Al
0.59 Ta
0.41)O
3 (LSAT) substrates, were used as epitaxial buffer layers to induce different types of strain in SLCO. For the tensile strained SLCO films on Ba
0.55Sr
0.45TiO
3 and on Ba
0.7Sr
0.3TiO
3 layers, short time (several minutes) reduction annealing was found to be effective for the removal of excess apical-oxygen and the appearance of superconductivity, whereas the reduction annealing was less effective for the compressively strained SLCO films on Ba
0.4Sr
0.6TiO
3 layers. Moreover, strong thickness dependences of superconducting properties have been observed for tensile strained layers. Based on these results, the strain and reduction effects of the SLCO film properties are discussed.