Title :
Assessment of Circuit Optimization Techniques Under NBTI
Author :
Xiaoming Chen ; Yu Wang ; Huazhong Yang ; Yuan Xie ; Yu Cao
Author_Institution :
Dept. of EE, Tsinghua Univ., Beijing, China
Abstract :
This paper conducts a comprehensive study on existing circuit optimization techniques against NBTI, degradation mechanism that has become a critical reliability issue for nano-scaled IC design. These techniques are categorized by their intrinsic characteristics, and several important observations are made to give design guideline on NBTI mitigation.
Keywords :
circuit optimisation; integrated circuit design; integrated circuit reliability; negative bias temperature instability; NBTI mitigation; circuit optimization; degradation mechanism; nanoscaled IC design; reliability; Aging; Circuit optimization; Degradation; Delays; Equipment; Logic gates; Stress; Transistors; circuit optimization techniques; negative bias temperature instability; reliability;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2266651
