Title :
A Novel Two-Port Behavioral Model for I/O Buffer Overclocking Simulation
Author :
Dghais, Wael ; Reis Cunha, Telmo ; Pedro, Jose C.
Author_Institution :
Dept. of Electron., Telecommun. & Inf., Inst. of Telecommun., Aveiro, Portugal
Abstract :
This paper presents the first behavioral model solution to the computationally efficient simulation of digital I/O buffers under overclocking operation. Our physics-based two-port approach relies on predicting the timing signals that control the activation of the driver´s output stage. The identified nonlinear dynamic model operators of the input port replace the concatenated fixed step-input describing functions of the previous table-based I/O buffer information specification and of other parametric approaches. The implemented gray-box model produces more accurate results than the previous methodologies when assessing the signal integrity performance of high-speed digital links in normal and overclocking conditions under various input excitations. However, it still preserves the computational efficiency recognized for its behavioral model predecessors.
Keywords :
buffer circuits; digital integrated circuits; I/O buffer overclocking simulation; concatenated fixed step-input; gray-box model; nonlinear dynamic model operators; two-port behavioral model; Computational modeling; Integrated circuit modeling; Logic gates; Nonlinear dynamical systems; Ports (Computers); Solid modeling; Timing; Digital output buffers/drivers; nonlinear system identification; signal integrity; table-based behavioral modeling; transient analysis;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2013.2260861