Title :
Correction to “Improved Low-Voltage-Triggered SCR Structure for RF-ESD Protection” [Aug 13 1050-1052]
Author :
Ma, Fa-Jun ; Han, Yi ; Dong, Shuai ; Miao, Meng ; Liang, Hongjing
Author_Institution :
Institute of Microelectronics and Optoelectronics, Zhejiang University, Hangzhou, China
Abstract :
There is an error in Fig. 1 in the above-named letter [ibid., vol. 34, no. 8, pp. 1050-1052, Aug. 2013]. The corrected figure is published here.
Keywords :
CMOS integrated circuits; Electrostatic discharges; Leakage currents; Radiofrequency integrated circuits; Rectifiers; Thyristors;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2013.2275615
