DocumentCode :
1757534
Title :
Evaluation of Point Field Sensing in IGBT Modules for High-Bandwidth Current Measurement
Author :
Schneider, P.E. ; Horio, Masafumi ; Lorenz, Robert D.
Author_Institution :
ABB Corp. Res. Center, Raleigh, NC, USA
Volume :
49
Issue :
3
fYear :
2013
fDate :
May-June 2013
Firstpage :
1430
Lastpage :
1437
Abstract :
This paper evaluates field-based current sensing integration in power electronic modules. Point field detectors, such as giant magnetoresistor detectors, can provide high-bandwidth (dc to megahertz) current measurements with a small footprint (1.26 mm2). Magnetic fields surrounding a current-carrying conductor are frequency dependent, so the 5 % flat-bandwidth metric is used to evaluate placement of the point field detectors to maximize the bandwidth of the current measurement. A significant contribution of this paper is an evaluation of the placement of point field detectors inside a power switching module. This paper focuses on detector placement for the interconnect structures commonly found in power switching modules. Experimental and finite-element analysis of wire bond structures with multiple wire bonds and lead frame structures are evaluated for high-bandwidth sensing performance.
Keywords :
finite element analysis; giant magnetoresistance; insulated gate bipolar transistors; power bipolar transistors; power electronics; IGBT modules; current measurements; current-carrying conductor; field-based current sensing; finite-element analysis; giant magnetoresistor detectors; high-bandwidth current measurement; high-bandwidth sensing; lead frame structures; magnetic fields; point field detectors; point field sensing; power electronic modules; power switching modules; wire bond structures; Bandwidth; Conductors; Copper; Detectors; Magnetic field measurement; Materials; Wires; Current measurement; giant magnetoresistance; integrated circuit packaging; magnetic sensors;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2013.2252595
Filename :
6479308
Link To Document :
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