• DocumentCode
    1757610
  • Title

    Dynamic and Transient Analysis of Silicon-Based Thin-Film Transistors: Channel Propagation Model

  • Author

    Jin, Jong W. ; Vanel, J.-C. ; Daineka, Dmitri ; Mohammed-Brahim, T. ; Bonnassieux, Yvan

  • Author_Institution
    LPICM, Ecole Polytech., Palaiseau, France
  • Volume
    9
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    871
  • Lastpage
    876
  • Abstract
    The quasi-static approach in the dynamic modeling considers that a thin-film transistor (TFT) reaches the steady-state instantaneously, and how to insert its behavior before steady-state is an important issue. In this paper, dynamic responses of silicon-based TFTs under gate-voltage pulse are studied in details. We experimentally distinguish quasi-static and non-quasi-static cases and we identify two charging regimes of the channel formation: channel propagation and charging of the fully propagated channel. We propose a model for the channel propagation, with a compact model-like approach to take into account the effect of defect states.
  • Keywords
    elemental semiconductors; semiconductor device testing; silicon; thin film transistors; channel propagation model; dynamic analysis; dynamic modeling; dynamic responses; gate-voltage pulse; quasi-static approach; silicon-based thin-film transistors; transient analysis; Capacitance; Electrodes; Integrated circuit modeling; Logic gates; Mathematical model; Semiconductor device modeling; Thin film transistors; Channel formation; delay time; dynamic measurement; intrinsic capacitances; non-quasi-static model; thin-film transistor (TFT); transient;
  • fLanguage
    English
  • Journal_Title
    Display Technology, Journal of
  • Publisher
    ieee
  • ISSN
    1551-319X
  • Type

    jour

  • DOI
    10.1109/JDT.2013.2250912
  • Filename
    6479318