Title :
Reduction of Stray Losses in Flange–Bolt Regions of Large Power Transformer Tanks
Author :
Olivares-Galvan, J.C. ; Magdaleno-Adame, S. ; Escarela-Perez, R. ; Ocon-Valdez, Rodrigo ; Georgilakis, P.S. ; Loizos, George
Author_Institution :
Dept. de Energia, Univ. Autonoma Metropolitana de Azcapotzalco, Mexico City, Mexico
Abstract :
In large power transformers, the presence of stray currents in the structural elements near the high current bushings can be considerable, and this leads to hot spots. This work presents a practical analysis of overheating in the bolts that join the tank and the cover, which are near the high current bushings of the transformer. Overheating results are analyzed and discussed for the case of a 420-MVA transformer. The hot spots in the flange-bolt regions are discovered by thermal maps that are obtained during power transformer operation as a part of a preventive maintenance program. In this paper, we use copper links to ensure the connection of both the cover and tank body, significantly reducing the overheating of the flange-bolt region. The copper link solution has been validated by measurements. We have used calibrated measurement instruments in all the experiments. Moreover, a 3-D finite-element analysis of the geometry of interest has been used to verify the copper link solution.
Keywords :
bushings; calibration; fasteners; finite element analysis; flanges; losses; power transformer insulation; preventive maintenance; tanks (containers); 3D finite element analysis; apparent power 420 MVA; copper link; flange-bolt region; high current bushings; measurement instruments calibration; overheating reduction; power transformers tank; preventive maintenance program; stray current; stray loss reduction; structural elements; tank cover; thermal maps; Copper; Fasteners; Finite element analysis; Heating; Oil insulation; Power transformer insulation; Flange–bolt regions; hot spots; low-voltage (LV) bushings; overheating; power transformer; stray currents; tank cover; thermography; transformer failures;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2013.2279373