Title :
Digital-to-Time Synthesizers: Separating Delay Line Error Spurs and Quantization Error Spurs
Author :
Talwalkar, Sumit A.
Author_Institution :
Motorola Solutions, Inc., Plantation, FL, USA
Abstract :
This paper analyzes the spurs due to delay line (DL) buffer mismatch errors and phase quantization errors in a digital-to-time conversion (DTC) direct frequency synthesizer. Applying the time/frequency axis scaling property of the Discrete Fourier Transform (DFT) to a close approximation of the general case of both buffer error and quantization error spurs, it is shown that the spur spectra for all possible output frequencies can be divided into a very small number of classes. All the spectra within a class are scaled and systematically re-arranged versions of each other. For a DTC with a phase accumulator with I integer and M fractional bits, this result simplifies the number of spectra from 2(I+M) to M. The condition that allows separation of the buffer errors spur locations from the quantization error spur location is derived. Spurs predicted based on the analysis match closely with actual measurements performed on a 90 nm CMOS DTC synthesizer. The spur analysis also applies to the flying adder (FA) synthesizer.
Keywords :
CMOS logic circuits; adders; delay lines; discrete Fourier transforms; frequency synthesizers; time-frequency analysis; CMOS DTC synthesizer; DFT; DL buffer mismatch errors; DTC direct frequency synthesizer; FA synthesizer; buffer error spur location separation; delay line error spurs; digital-to-time conversion direct frequency synthesizer; discrete Fourier transform; flying adder synthesizer; fractional bits; phase accumulator; phase quantization errors; quantization error spur location; size 90 nm; time-frequency axis scaling property; Delay lines; Delays; Discrete Fourier transforms; Frequency synthesizers; Quantization; Synthesizers; Time-frequency analysis; Buffer errors; DFT axis scaling property; delay line (DL); digital-to-time converter (DTC) synthesizer; flying adder; mismatch errors; quantization errors;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2013.2249152