DocumentCode :
1758052
Title :
Modeling On-Board Via Stubs and Traces in High-Speed Channels for Achieving Higher Data Bandwidth
Author :
Ki Jin Han ; Xiaoxiong Gu ; Kwark, Young H. ; Lei Shan ; Ritter, Mark B.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
4
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
268
Lastpage :
278
Abstract :
To achieve a target data bandwidth in high-speed channels, an on-board channel modeling study was presented in this paper. A design guideline was found by observing the variation of link performance, depending on parameters such as channel length, baud rate, and the number of signal layers. The channel performance was investigated using a newly developed parametric simulation environment supported by a fast multilayered via transition modeling tool. The extensive parameter sweep simulations showed that an allowable channel reach has a lower and an upper bound limited by stub via effect and trace loss, respectively. Under a specified channel reach, the aggregate data bandwidths were estimated using a particle swarm optimization routine, and a tradeoff relation among the wiring capability and the maximum allowable data rate was observed. From these observations, the approach provides a guideline to select the number of signal layers for achieving the required data bandwidth.
Keywords :
multichip modules; particle swarm optimisation; vias; aggregate data bandwidth; extensive parameter sweep simulation; fast multilayered via transition modeling tool; high speed channels; on-board channel modeling; on-board via stubs; parametric simulation; particle swarm optimization; stub via effect; trace loss; Bandwidth; Channel estimation; Channel models; Data models; Guidelines; Integrated circuit modeling; Manufacturing; Aggregate data bandwidth; Serializer/Deserializer (SerDes); backdrilling; baud rate; channel reach; design guideline; equalization; high-speed links; multilayered board; multiple package modules; parametric simulation; particle swarm optimization (PSO); transmission line loss; via stub effect;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2013.2277291
Filename :
6584771
Link To Document :
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