DocumentCode :
1758320
Title :
Repeatability and Mismatch of Waveguide Flanges in the 500–750 GHz Band
Author :
Huilin Li ; Arsenovic, Alexander ; Hesler, J.L. ; Kerr, A.R. ; Weikle, Robert M.
Author_Institution :
Dept. of Electr. & Comput. Eng. Dept., Univ. of Virginia, Charlottesville, VA, USA
Volume :
4
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
39
Lastpage :
48
Abstract :
This paper presents a study characterizing the connection repeatability and reflection coefficient of submillimeter waveguide flanges in the 500-750 GHz band (WR-1.5 or WM-380). The connection repeatability of four types of flange was measured using one-port measurements and a “load-reference” technique with a vertically mounted system to mitigate gravitational bias. To measure the error-corrected complex reflection coefficients of pairs of waveguide flanges, a calibration procedure insensitive to flange misalignment was used. This SDD(RO) calibration method employs four standards: a flush short, two delay shorts with different but unspecified offsets, and a radiating open-ended waveguide. The uncertainty associated with this calibration method is investigated and it is used to estimate the reflection coefficient resulting from flange misalignment.
Keywords :
calibration; submillimetre wave devices; waveguides; WM-380; WR-1.5; calibration; connection repeatability; delay shorts; error-corrected complex reflection coefficients; flange misalignment; flush short; frequency 500 GHz to 750 GHz; gravitational bias; load-reference technique; one-port measurements; radiating open-ended waveguide; submillimeter waveguide flanges; unspecified offsets; vertically mounted system; waveguide flange mismatch; waveguide flange repeatability; Calibration; Delays; Extraterrestrial measurements; Flanges; Measurement uncertainty; Phase measurement; Standards; Calibration; submillimeter-wave measurements; waveguide flanges; waveguide interfaces; waveguides;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2013.2283540
Filename :
6663704
Link To Document :
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