• DocumentCode
    1758395
  • Title

    Cathode Plasma Integral Spectroscopy Diagnosis on High Current Pulsed Electron Beam Diode

  • Author

    Yao Weibo ; Zhang Yongmin ; Tang Junping ; Guo Jianming ; Cheng Liang

  • Author_Institution
    State Key Lab. of Intense Pulsed Radiat. Simulation & Effect, Xi´an, China
  • Volume
    42
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    3264
  • Lastpage
    3267
  • Abstract
    Cathode plasma is an important factor affecting the cathode emission on high current pulsed electron beam diode. Diagnosing the cathode plasma composition by integral spectrum system is a method for studying the cathode plasma formation and development process. The aim of this paper is to study the cathode plasma composition and analyze the cathode plasma formation mechanism by integral spectroscopic diagnosis of different materials and cathode pretreatments. Experiment results show that not only cathode material itself, but also impurity material and adsorptive gas on cathode surface are found in the cathode plasma. For the same material, the cathode plasma composition remains unchanged, whereas the characteristic line intensity decreases as the experiment times increase. The composition of the cathode plasma can be controlled by adulterated treatment.
  • Keywords
    plasma diagnostics; plasma diodes; plasma impurities; plasma sources; spectral line intensity; adsorptive gas; cathode emission; cathode plasma composition; cathode plasma formation mechanism; cathode plasma integral spectroscopy diagnosis; cathode pretreatments; characteristic line intensity; high current pulsed electron beam diode; impurity material; Cathodes; Copper; Electron beams; Graphite; Materials; Plasmas; Surface treatment; Cathode plasma; electron beam; high current diode; integral spectroscopy; integral spectroscopy.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2014.2305653
  • Filename
    6855325