• DocumentCode
    1758625
  • Title

    Dynamic Control of Photoresponse in ZnO-Based Thin-Film Transistors in the Visible Spectrum

  • Author

    Aygun, Levent E. ; Oruc, F.B. ; Atar, Fatih B. ; Okyay, A.K.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Bilkent Univ., Ankara, Turkey
  • Volume
    5
  • Issue
    2
  • fYear
    2013
  • fDate
    41365
  • Firstpage
    2200707
  • Lastpage
    2200707
  • Abstract
    We present ZnO-channel thin-film transistors with actively tunable photocurrent in the visible spectrum, although ZnO band edge is in the ultraviolet. ZnO channel is deposited by atomic layer deposition technique at a low temperature (80 °C), which is known to introduce deep level traps within the forbidden band of ZnO. The gate bias dynamically modifies the occupancy probability of these trap states by controlling the depletion region in the ZnO channel. Unoccupied trap states enable the absorption of the photons with lower energies than the bandgap of ZnO. Photoresponse to visible light is controlled by the applied voltage bias at the gate terminal.
  • Keywords
    II-VI semiconductors; atomic layer deposition; deep levels; energy gap; photoemission; photoexcitation; photoluminescence; thin film transistors; visible spectra; wide band gap semiconductors; zinc compounds; ZnO; actively tunable photocurrent; applied voltage bias; band edge; bandgap; channel thin-film transistors; deep level traps; depletion region; dynamic control; forbidden band; gate bias; gate terminal; low temperature atomic layer deposition; occupancy probability; photon absorption; photoresponse; temperature 80 degC; ultraviolet light; unoccupied trap states; visible light; visible spectrum; Absorption; Electron traps; Logic gates; Photonic band gap; Photonics; Thin film transistors; Zinc oxide; Metal oxide; TFT; defects; optoelectronic materials; oxide materials; phototransistor; transparent oxide; traps; tunable; visible;
  • fLanguage
    English
  • Journal_Title
    Photonics Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0655
  • Type

    jour

  • DOI
    10.1109/JPHOT.2013.2250274
  • Filename
    6479671