DocumentCode :
1758730
Title :
What Lies Ahead for Resistance-Based Memory Technologies?
Author :
Yoon-Jong Song ; Gitae Jeong ; In-Gyu Baek ; Jungdal Choi
Volume :
46
Issue :
8
fYear :
2013
fDate :
41487
Firstpage :
30
Lastpage :
36
Abstract :
Phase-change RAM, magnetic RAM, and resistive RAM offer strong scalability, speed, and power consumption advantages over conventional capacitance-based memory. Recent work shows the feasibility of mass producing these new devices and their suitability for next-generation technology.
Keywords :
MRAM devices; integrated circuit reliability; phase change memories; capacitance-based memory; magnetic RAM; next-generation technology; phase-change RAM; power consumption; resistance-based memory technologies; resistive RAM; Electrodes; Magnetic resonance imaging; Magnetic tunneling; Phase change random access memory; Power distribution; Random access memory; MRAM; PRAM; ReRAM; resistance-based memory devices;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.2013.221
Filename :
6527245
Link To Document :
بازگشت