• DocumentCode
    1759281
  • Title

    A Fault Analysis Perspective for Testing of Secured SoC Cores

  • Author

    Ali, Sk Subidh ; Mazumdar, Bodhisatwa ; Mukhopadhyay, Debdeep

  • Author_Institution
    Eng. Dept., New York Univ. Abu Dhabi, Abu Dhabi, United Arab Emirates
  • Volume
    30
  • Issue
    5
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    63
  • Lastpage
    73
  • Abstract
    Can the inputs of a cryptocore be stressed to leak the secret key? This article demonstrates such a vulnerability challenging secure integration of these cores in a system-on-chip design.
  • Keywords
    cryptography; integrated circuit design; integrated circuit reliability; system-on-chip; cryptocore; fault analysis perspective; secret key; secured SoC core testing; system-on-chip design; vulnerability-challenging secure integration; Algorithm design and analysis; Circuit faults; Doped fiber amplifiers; Fault diagnosis; Field programmable gate arrays; Mathematical model; System-on-chip; AES; AES key schedule; Differential Fault Analysis; Fault Model; SoC;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2252951
  • Filename
    6480791
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1759281