Title :
A Fault Analysis Perspective for Testing of Secured SoC Cores
Author :
Ali, Sk Subidh ; Mazumdar, Bodhisatwa ; Mukhopadhyay, Debdeep
Author_Institution :
Eng. Dept., New York Univ. Abu Dhabi, Abu Dhabi, United Arab Emirates
Abstract :
Can the inputs of a cryptocore be stressed to leak the secret key? This article demonstrates such a vulnerability challenging secure integration of these cores in a system-on-chip design.
Keywords :
cryptography; integrated circuit design; integrated circuit reliability; system-on-chip; cryptocore; fault analysis perspective; secret key; secured SoC core testing; system-on-chip design; vulnerability-challenging secure integration; Algorithm design and analysis; Circuit faults; Doped fiber amplifiers; Fault diagnosis; Field programmable gate arrays; Mathematical model; System-on-chip; AES; AES key schedule; Differential Fault Analysis; Fault Model; SoC;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2252951
