Title :
Long Measurement Range OFDR Beyond Laser Coherence Length
Author :
Zhenyang Ding ; Yao, X. Steve ; Tiegen Liu ; Yang Du ; Kun Liu ; Qun Han ; Zhuo Meng ; Junfeng Jiang ; Hongxin Chen
Author_Institution :
Coll. of Precision Instrum. & Opto-Electron. Eng., Tianjin Univ., Tianjin, China
Abstract :
We present a novel method to significantly extend the measurement range of an optical frequency domain reflectometry (OFDR) beyond the laser coherence length for both discrete reflection (such as Fresnel reflection) and Rayleigh backscattering measurements. A key to the method is to increase the laser frequency tuning speed while measuring the phase noise of the reflected optical signal that carries the location and reflectivity information. Using this technique in a conventional OFDR with a noise floor of -120 dB and a dynamic range of 53 dB, we achieved a measurable distance of 170 km for Fresnel reflection and 120 km for Rayleigh backscattering using a laser with a coherence length of only 13.6 km.
Keywords :
Rayleigh scattering; backscatter; phase noise; reflectometry; Fresnel reflection; OFDR; Rayleigh backscattering; laser coherence length; laser frequency tuning; optical frequency domain reflectometry; phase noise; size 120 km; size 13.6 km; size 170 km; Laser noise; Measurement by laser beam; Optical fibers; Optical interferometry; Optical reflection; Frequency domain analysis; optical fiber measurement; phase noise; reflectometry;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2012.2233728