• DocumentCode
    1759675
  • Title

    Practical Aspects of EIK Technology

  • Author

    Berry, Dave ; Deng, H. ; Dobbs, Richard ; Horoyski, Peter ; Hyttinen, Mark ; Kingsmill, Andrew ; MacHattie, Ross ; Roitman, Albert ; Sokol, Ed ; Steer, Brian

  • Author_Institution
    Commun. & Power Ind. Canada Inc., Georgetown, ON, Canada
  • Volume
    61
  • Issue
    6
  • fYear
    2014
  • fDate
    41791
  • Firstpage
    1830
  • Lastpage
    1835
  • Abstract
    Significant progress in modeling and manufacturing technologies open wide possibilities for performance improvements of millimeter-wave vacuum electron devices. However, many practical aspects should be considered to realize reliable long-life high-power sources. These are: thermal and RF stability, materials and assembly sensitivity to manufacturing, electrical stresses, cathode poisoning prevention, thermal beam effects, and many others. We address the full spectrum of design and manufacturing aspects while developing state-of-the-art extended interaction klystrons (EIKs). EIKs provide unprecedented RF performance and reliability in a compact user-friendly package. This paper discusses EIK design methodology and manufacturing concepts stating self-imposed restrictions and design modifications enhancing power capability, bandwidth, and extending operating frequencies into the terahertz region.
  • Keywords
    cathodes; electron device manufacture; electronics packaging; integrated circuit reliability; klystrons; millimetre wave devices; thermal stability; EIK technology; RF stability; cathode poisoning prevention; compact user-friendly package; design modifications; electrical stresses; extended interaction klystrons; high-power sources; manufacturing technology; millimeter wave vacuum electron devices; power capability; reliability; self-imposed restrictions; terahertz region; thermal beam effects; thermal stability; Assembly; Cathodes; Cavity resonators; Optical beams; Optics; Radio frequency; Stress; Dispenser cathode; electron devices; extended interaction klystron (EIK); millimeter wave; terahertz (THz); terahertz (THz).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2302741
  • Filename
    6734705