DocumentCode
1759721
Title
Laser-Based Sensing, Measurement, and Misalignment Control of Coupled Linear and Angular Motion for Ultrahigh Precision Movement
Author
Clark, Leon ; Shirinzadeh, Bijan ; Yanling Tian ; Oetomo, D.
Author_Institution
Dept. of Mech. & Aerosp. Eng., Monash Univ., Clayton, VIC, Australia
Volume
20
Issue
1
fYear
2015
fDate
Feb. 2015
Firstpage
84
Lastpage
92
Abstract
This paper presents a novel methodology for position and orientation (pose) measurement of stages used for micro/nano positioning which produce coupled motions with three planar degrees of freedom (DOF). In the proposed methodology, counter-rotation of the entire mechanism prevents the misalignment of the measurement beams within a laser-interferometry-based sensing and measurement technique. To detect such a misalignment, a sensing strategy constructed around a position sensitive diode has been developed. A feedforward-feedback compound controller has been established to provide the necessary counter-rotation input to reduce the misalignment error. Experimental validation has been conducted through the measurement of the workspace of a three-DOF planar micro/nano positioning stage. Experimental results demonstrate the capability of the technique to provide combined linear/angular measurement.
Keywords
feedback; feedforward; light interferometry; measurement by laser beam; measurement errors; microsensors; motion control; motion measurement; nanosensors; position measurement; semiconductor lasers; DOF; angular motion measurement; coupled linear motion measurement; degree of freedom; feedforward-feedback compound controller; laser interferometry-based sensing; misalignment control; misalignment error reduction; necessary counter rotation; orientation measurement; planar micropositioning; planar nanopositioning; position measurement; position sensitive diode; ultrahigh precision movement; Assembly; Laser beams; Lenses; Measurement by laser beam; Position measurement; Rotation measurement; Sensors; Coupled three-degrees-of-freedom (three-DOF) motion; laser interferometer-based sensing; micro/nano positioning;
fLanguage
English
Journal_Title
Mechatronics, IEEE/ASME Transactions on
Publisher
ieee
ISSN
1083-4435
Type
jour
DOI
10.1109/TMECH.2014.2301824
Filename
6734710
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