Title :
Characteristics of 600, 1200, and 3300 V Planar SiC-MOSFETs for Energy Conversion Applications
Author :
Imaizumi, Masayuki ; Miura, Naruhisa
Author_Institution :
Power Device Works, Mitsubishi Electr. Corp., Fukuoka, Japan
Abstract :
SiC-MOSFETs provide superior performance for next generation power electronics systems. High threshold voltage 600 V SiC-MOSFETs were realized utilizing a reoxidation process, which drastically improves a tradeoff between an ON-resistance and a threshold voltage. Low-loss SiC-MOSFETs with a 1200 V/100-A rating have been developed. Using the developed SiC-MOSFETs, 1200 V/800-A high-power full SiC module with an ON-resistance as low as 2.9 mΩ at 150 °C was successfully fabricated. The high-power module markedly reduces power loss especially at high carrier frequency. Large-area 3300 V SiC-MOSFETs with an ON-resistance of 52 mΩ at 175 °C exhibit an adequate reverse bias safe operating area and 3300 V SiC-MOSFETs screened by applying a body diode current stress show stable characteristics under a continuous current through their body diode for 1000 h.
Keywords :
power MOSFET; power convertors; silicon compounds; wide band gap semiconductors; SiC; body diode; continuous current; current 800 A; energy conversion; low ON-resistance MOSFET; low loss MOSFET; planar MOSFET; resistance 2.9 mohm; resistance 52 mohm; temperature 150 C; temperature 175 C; threshold voltage; voltage 1200 V; voltage 3300 V; voltage 600 V; Inverters; Logic gates; MOSFET; Silicon carbide; Temperature dependence; Threshold voltage; Body diode; planar MOSFET; power module; reverse bias safe operating area (RBSOA); silicon carbide (SiC); switching loss; threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2014.2358581