DocumentCode :
175983
Title :
Lot release strategy semiconductor assembly and testing based on the degree of constraint of the minimum spanning tree
Author :
Zhang Guohui ; Chang Liu ; Yao Lili ; Shi Haibo
Author_Institution :
R&D Center for Internet of things, China
fYear :
2014
fDate :
May 31 2014-June 2 2014
Firstpage :
1735
Lastpage :
1739
Abstract :
The production of semiconductor assembly and testing is wide variety, and the cost of produce time of switch between different products is not the same, which could lead to its utilization is lower, production cycle longer. Thus lot release control plays an important role for improving utilization and shorter production cycle for semiconductor assembly and testing system. In this paper, we modeled as a graph theory for solving constrained minimum spanning tree problem. Using mainstream Prim algorithm, we solve it to give each product sequence and specific lot release time. It have solved the extra time problem that caused by blinding lot release, and finally, through applied research we verified the effectiveness and superiority of it. The proposed strategy can reduce the change machine costs, shorten production cycle and improve production efficiency.
Keywords :
assembling; semiconductor device manufacture; trees (mathematics); change machine costs; constrained minimum spanning tree problem; graph theory; lot release control; lot release strategy semiconductor assembly; lot release time; mainstream Prim algorithm; product sequence; production cycle; production efficiency; testing system; Assembly; Companies; Decision support systems; Graph theory; Production; Testing; Ventilation; Prim algorithm; graph theory; minimum spanning tree; semiconductor assembly and testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Decision Conference (2014 CCDC), The 26th Chinese
Conference_Location :
Changsha
Print_ISBN :
978-1-4799-3707-3
Type :
conf
DOI :
10.1109/CCDC.2014.6852449
Filename :
6852449
Link To Document :
بازگشت