DocumentCode :
1760095
Title :
Verification Testing of ITER Nb3Sn Strand at the NHMFL
Author :
McGuire, David R. ; Jun Lu ; Hill, Scott ; Dellinger, Kegan ; Sloan, Timothy ; Chan, Kevin ; Martovetsky, Nicolai N.
Author_Institution :
Nat. High Magn. Field Lab., Tallahassee, FL, USA
Volume :
25
Issue :
3
fYear :
2015
fDate :
42156
Firstpage :
1
Lastpage :
4
Abstract :
The large quantity of Nb3Sn superconducting wire needed by ITER presents a significant challenge to ensure that all wires adhere to ITER specifications. The National High Magnetic Field Laboratory, USA performed verification tests for Nb3Sn strands used in ITER TF magnets. Converting a research laboratory into a large quantity testing facility presented many challenges in developing standard operating procedures for all the verification tests. Verification tests required by ITER include: unreacted-chrome-plated strand diameter, twist pitch and twist direction, chrome-plating thickness, unreacted-chrome-plated strand Cu-to-non-Cu volume ratio, residual resistivity ratio of Cr-plated strand (RRR), critical current at 4.22 K and 12 T (Ic), resistive transition index at 4.22 K and 12 T (n-value), and hysteresis loss per strand unit volume at 4.22 K over a ±3 T cycle. Additionally, due to the brittle nature of Nb3Sn superconducting wire, some samples were damaged in a controlled manner to explore the negative extremes of damage due to sample handling. We successfully completed the verification tests of ITER TF Nb3Sn strands made by US vendors.
Keywords :
brittleness; critical current density (superconductivity); electrical resistivity; magnetic hysteresis; niobium alloys; superconducting magnets; tin alloys; type II superconductors; Cr-plated strand; ITER TF magnets; ITER strand; NHMFL; Nb3Sn; US vendors; brittle nature; chrome-plating thickness; critical current; high magnetic field laboratory; hysteresis loss; large quantity testing facility; residual resistivity ratio; resistive transition index; strand unit volume; superconducting wire; unreacted-chrome-plated strand diameter; unreacted-chrome-plated strand volume ratio; verification testing; Heat treatment; Integrated circuits; Microscopy; Niobium-tin; Organizations; Temperature measurement; Wires; Critical current; ITER; Nb3Sn; RRR; critical current; hysteresis loss;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2014.2382032
Filename :
6987244
Link To Document :
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