DocumentCode
1760101
Title
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain
Author
Guin, Ujjwal ; Ke Huang ; DiMase, Daniel ; Carulli, John M. ; Tehranipoor, Mohammad ; Makris, Yiorgos
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT, USA
Volume
102
Issue
8
fYear
2014
fDate
Aug. 2014
Firstpage
1207
Lastpage
1228
Abstract
As the electronic component supply chain grows more complex due to globalization, with parts coming from a diverse set of suppliers, counterfeit electronics have become a major challenge that calls for immediate solutions. Currently, there are a few standards and programs available that address the testing for such counterfeit parts. However, not enough research has yet addressed the detection and avoidance of all counterfeit parts-recycled, remarked, overproduced, cloned, out-of-spec/defective, and forged documentation-currently infiltrating the electronic component supply chain. Even if they work initially, all these parts may have reduced lifetime and pose reliability risks. In this tutorial, we will provide a review of some of the existing counterfeit detection and avoidance methods. We will also discuss the challenges ahead for implementing these methods, as well as the development of new detection and avoidance mechanisms.
Keywords
integrated circuits; reliability; risk management; supply chain management; counterfeit avoidance methods; counterfeit detection methods; counterfeit integrated circuits; electronic component supply chain; global semiconductor supply chain; globalization; reliability risk; Consumer electronics; Globalization; Hardware; Integrated circuit modeling; Integrated circuits; Semiconductor device measurement; Semiconductor devices; Supply chain management; Supply chains; AC/DC parametric tests; counterfeit integrated circuits (ICs); electrical inspection; hardware security; machine learning; path-delay test; physical inspection;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2014.2332291
Filename
6856206
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