Title :
Reliability-Aware Microarchitecture Design [Guest editor´s introduction]
Author :
Reddi, Vijay Janapa
Author_Institution :
University of Texas at Austin
Abstract :
This introduction to the special issue on reliability-aware microarchitecture discusses challenges facing processor architects and highlights the seven articles in the issue.
Keywords :
Computer architecture; Energy efficiency; Integrated circuit reliability; Microprocessors; Program processors; Reliability engineering; Special issues and sections; cross-layer research; performance; power; reliability; reliability-aware microarchitecture;
Journal_Title :
Micro, IEEE