DocumentCode :
1760233
Title :
Improving Throughput of Power-Constrained Many-Core Processors Based on Unreliable Devices
Author :
Hao Wang ; Nam Sung Kim
Author_Institution :
Univ. of Wisconsin-Madison, Madison, WI, USA
Volume :
33
Issue :
4
fYear :
2013
fDate :
July-Aug. 2013
Firstpage :
16
Lastpage :
24
Abstract :
Using slightly less device-level redundancy than is necessary to make all processor cores defect free actually makes cores smaller, faster, and more power efficient. Under the same power and yield constraints, a carbon nanotube processor with less device-level redundancy can provide 1.75x higher throughput, while also being nearly 2x smaller than a similar processor that has more device-level redundancy and makes all cores defect free.
Keywords :
carbon nanotubes; microprocessor chips; redundancy; carbon nanotube processor; device-level redundancy; power-constrained many-core processors; unreliable devices; yield constraints; CMOS integrated circuits; Carbon nanotubes; Inverters; Multicore processing; Power system reliability; Program processors; Redundancy; System-on-chip; carbon nanotube; many-core processor; power constraint; reliability;
fLanguage :
English
Journal_Title :
Micro, IEEE
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/MM.2013.69
Filename :
6527885
Link To Document :
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