Title :
Reliability, Theme Issues, and Plagiarism
Author_Institution :
Thomas J. Watson Research Center
Abstract :
This column discusses the special issue on reliability, <it>IEEE Micro</it>´s requirement that authors add new material to any previously published work, and issues of plagiarism.
Keywords :
IEEE; hard errors; plagiarism; power; reliability; soft errors; temperature; theme issues; voltage;
Journal_Title :
Micro, IEEE
