DocumentCode :
1760308
Title :
Permanent Phase Correction in a Polarization Diversity Si PIC by Femtosecond Laser Pulses
Author :
Bachman, Daniel ; Zhijiang Chen ; Westwood-Bachman, Jocelyn N. ; Hiebert, Wayne K. ; Painchaud, Yves ; Poulin, Michel ; Fedosejevs, Robert ; Tsui, Ying Y. ; Van, Vien
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
Volume :
27
Issue :
17
fYear :
2015
fDate :
Sept.1, 1 2015
Firstpage :
1880
Lastpage :
1883
Abstract :
We report a fast and efficient method for permanently correcting fabrication-induced phase errors in silicon photonic circuits. The method uses femtosecond laser pulses at 400-nm wavelength to amorphize a thin layer of crystalline silicon near the waveguide surface, thereby inducing a change in the effective index of the waveguide. Using a single femtosecond laser pulse, we reduced the polarization-dependent frequency shift between the two interferometers of a polarization diversity differential phase shift keying silicon demodulator from 11 GHz to less than 0.5 GHz, thereby restoring the polarization diversity operation of the circuit with little degradation to the circuit performance.
Keywords :
differential phase shift keying; elemental semiconductors; high-speed optical techniques; integrated optics; light polarisation; optical waveguides; silicon; Si; crystalline silicon; effective index; femtosecond laser pulses; interferometers; permanent phase correction; polarization diversity Si PIC; polarization diversity differential phase shift keying silicon demodulator; polarization-dependent frequency shift; silicon photonic circuits; Differential phase shift keying; Laser tuning; Optical waveguides; Silicon; Ultrafast optics; Waveguide lasers; DPSK demodulator; Silicon photonics; femtosecond laser tuning; polarization diversity; silicon photonics;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2015.2444394
Filename :
7122238
Link To Document :
بازگشت