• DocumentCode
    1760308
  • Title

    Permanent Phase Correction in a Polarization Diversity Si PIC by Femtosecond Laser Pulses

  • Author

    Bachman, Daniel ; Zhijiang Chen ; Westwood-Bachman, Jocelyn N. ; Hiebert, Wayne K. ; Painchaud, Yves ; Poulin, Michel ; Fedosejevs, Robert ; Tsui, Ying Y. ; Van, Vien

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
  • Volume
    27
  • Issue
    17
  • fYear
    2015
  • fDate
    Sept.1, 1 2015
  • Firstpage
    1880
  • Lastpage
    1883
  • Abstract
    We report a fast and efficient method for permanently correcting fabrication-induced phase errors in silicon photonic circuits. The method uses femtosecond laser pulses at 400-nm wavelength to amorphize a thin layer of crystalline silicon near the waveguide surface, thereby inducing a change in the effective index of the waveguide. Using a single femtosecond laser pulse, we reduced the polarization-dependent frequency shift between the two interferometers of a polarization diversity differential phase shift keying silicon demodulator from 11 GHz to less than 0.5 GHz, thereby restoring the polarization diversity operation of the circuit with little degradation to the circuit performance.
  • Keywords
    differential phase shift keying; elemental semiconductors; high-speed optical techniques; integrated optics; light polarisation; optical waveguides; silicon; Si; crystalline silicon; effective index; femtosecond laser pulses; interferometers; permanent phase correction; polarization diversity Si PIC; polarization diversity differential phase shift keying silicon demodulator; polarization-dependent frequency shift; silicon photonic circuits; Differential phase shift keying; Laser tuning; Optical waveguides; Silicon; Ultrafast optics; Waveguide lasers; DPSK demodulator; Silicon photonics; femtosecond laser tuning; polarization diversity; silicon photonics;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2015.2444394
  • Filename
    7122238