Title :
Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs
Author :
Ladbury, Raymond L. ; Berg, Melanie D. ; Wilcox, Edward P. ; LaBel, Kenneth A. ; Kim, Hak S. ; Phan, Anthony M. ; Seidleck, Christina M.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
The speed, tight timing requirements packaging and complicated error behavior of DDR2 and DDR3 SDRAMs pose significant challenges for single-event testing. Often, each new generation will require an expensive new tester with a state-of-the-art controller for the memory. We explore the trade-offs in the use of commercial FPGA based evaluation boards for radiation testing DDR2 and DDR3 SDRAMs. We evaluate the resulting data quality and discuss tester performance while also elucidating and comparing SEE susceptibilities in DDR2 and DDR3 SDRAMs.
Keywords :
DRAM chips; field programmable gate arrays; integrated circuit testing; radiation hardening (electronics); DDR2 SDRAMs; DDR3 SDRAMs; FPGA-based evaluation boards; complicated error behavior; data quality; radiation testing; single-event testing; Field programmable gate arrays; Quality assurance; Radiation effects; Radiation hardening (electronics); Reliability; Risk management; SDRAM; Probabilistic risk assessment; quality assurance; radiation effects in ICs; radiation hardness assurance; reliability estimation; testing techniques;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2285517
