• DocumentCode
    1760901
  • Title

    Automated defect localization via low rank plus outlier modeling of propagating wavefield data

  • Author

    Gonella, Stefano ; Haupt, Jarvis

  • Author_Institution
    Dept. of Civil Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • Volume
    60
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    2553
  • Lastpage
    2565
  • Abstract
    This work proposes an agnostic inference strategy for material diagnostics, conceived within the context of laser-based nondestructive evaluation methods which extract information about structural anomalies from the analysis of acoustic wavefields measured on the structure´s surface by means of a scanning laser interferometer. The proposed approach couples spatiotemporal windowing with low rank plus outlier modeling, to identify a priori unknown deviations in the propagating wavefields caused by material inhomogeneities or defects, using virtually no knowledge of the structural and material properties of the medium. This characteristic makes the approach particularly suitable for diagnostics scenarios in which the mechanical and material models are complex, unknown, or unreliable. We demonstrate our approach in a simulated environment using benchmark point and line defect localization problems based on propagating flexural waves in a thin plate.
  • Keywords
    nondestructive testing; plates (structures); acoustic wavefields; automated defect localization; laser-based nondestructive evaluation methods; line defect localization problems; low rank plus outlier modeling; material diagnostics; material inhomogeneity; material models; material properties; mechanical models; propagating flexural waves; propagating wavefield data; scanning laser interferometer; simulated environment; spatiotemporal windowing; structural anomaly; structural properties; structure surface; thin plate; Acoustics; Data models; History; Material properties; Spatiotemporal phenomena; Vectors;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2013.2854
  • Filename
    6666076