• DocumentCode
    176098
  • Title

    Infrared image registration of damage in the aircraft skin based on lie group machine learning

  • Author

    Yunlin Luo ; Zhanxiao Yan ; Kun Wang ; Li Wang

  • Author_Institution
    Aeronaut. Autom. Coll., Civil Aviation Univ. of China, Tianjin, China
  • fYear
    2014
  • fDate
    May 31 2014-June 2 2014
  • Firstpage
    2104
  • Lastpage
    2108
  • Abstract
    The method of nondestructive testing for aircraft skin composite defects using infrared thermography is very effective. But, against the problem of how to rapidly and accurately identify for the defects of specific types needs to be further study. Based on the analysis of the existed classifier for skin damages, a complex group classifier based on lie group machine learning algorithm is introduced in this paper. According to the damage infrared thermal images obtained by the infrared thermal imager, the feature of internal defects of the skin specific defects is extracted and a discriminant function is established, and then a direct classification for the input image is realized. A simulation result proves that the algorithm given in this paper can satisfy the identification accuracy, and shows the effective of the algorithm.
  • Keywords
    Lie groups; aerospace engineering; aircraft testing; image registration; infrared imaging; learning (artificial intelligence); nondestructive testing; aircraft skin; composite defects; damage; infrared image registration; infrared thermal images; infrared thermography; lie group machine learning; nondestructive testing; Accuracy; Aircraft; Classification algorithms; Machine learning algorithms; Matrix decomposition; Skin; Training; Classifier of Symplectic Group; Image Registration; Infrared Imagery; Lie Group Machine Learning; Nondestructive Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (2014 CCDC), The 26th Chinese
  • Conference_Location
    Changsha
  • Print_ISBN
    978-1-4799-3707-3
  • Type

    conf

  • DOI
    10.1109/CCDC.2014.6852514
  • Filename
    6852514