Title :
A 2-Kb One-Time Programmable Memory for UHF Passive RFID Tag IC in a Standard 0.18 /spl mu/m CMOS Process
Author :
Ngoc Dang Phan ; Ik Joon Chang ; Jong-Wook Lee
Author_Institution :
Sch. of Electron. & Inf., Kyung Hee Univ., Suwon, South Korea
Abstract :
We present a 2-Kb one-time programmable (OTP) memory for UHF RFID applications. The OTP memory cell is based on a two-transistor (2-T) gate-oxide anti-fuse (AF) for low voltage operation. Reliability of memory cell is enhanced by limiting the maximum terminal voltages of thin-oxide and thick-oxide transistors to 1.8 V and 3.3 V, respectively. Improved low power circuit design techniques are used including auto shut-off for program mode and self-timed control for read mode. To further reduce power consumption, we develop a novel power-efficient charge pump. The designed OTP is successfully embedded into a UHF passive RFID tag IC that conforms to the EPCglobal Gen-2 standard. The tag chip was fabricated in a 0.18 m 1-poly 6-metal standard CMOS process with no additional masks. The total area of the chip including the I/Os and bonding pads is 2.3 × 1.5 mm2 where the OTP memory area is only 0.43 × 0.31 mm2. Our tag IC measurement shows that the read and write currents of the OTP memory are 17 μA and 58 μA, respectively.
Keywords :
CMOS integrated circuits; UHF integrated circuits; integrated circuit design; integrated circuit measurement; integrated memory circuits; low-power electronics; passive networks; power consumption; radiofrequency identification; CMOS; EPCglobal Gen-2 standard; UHF passive RFID tag IC; bonding pads; current 17 muA; current 58 muA; low power circuit design techniques; memory cell reliability; one-time programmable memory; power consumption; power-efficient charge pump; size 0.18 mum; thick-oxide transistors; thin-oxide transistors; two-transistor gate-oxide anti-fuse; voltage 1.8 V; voltage 3.3 V; Integrated circuits; Logic gates; Programming; Radiofrequency identification; Standards; Transistors; Anti-fuse; OTP memory; RFID; tag chip;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2012.2230500