DocumentCode :
1761231
Title :
Foreword for the Special Section on ESD Modeling, Characterization, and Design
Author :
Boselli, G.
Author_Institution :
Texas Instruments, Dallas , TX, USA
Volume :
13
Issue :
2
fYear :
2013
fDate :
41426
Firstpage :
370
Lastpage :
370
Abstract :
As the complexity of ESD design keeps increasing with the availability of new technologies and the demand for new applications, so do the challenges associated with robust ESD design. These challenges manifest themselves in a multitude of perspectives, including ESDmodeling, characterization, and design. To address each of the aforementioned issues, we have selected three invited papers that are extensions of original works presented at the 2012 EOS/ESD Symposium. The three papers are briefly summarized.
Keywords :
Circuit simulation; Electrostatic devices; Electrostatic discharges; High-voltage techniques; Special issues and sections;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2013.2264734
Filename :
6527996
Link To Document :
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