Title :
Foreword for the Special Section on ESD Modeling, Characterization, and Design
Author_Institution :
Texas Instruments, Dallas , TX, USA
Abstract :
As the complexity of ESD design keeps increasing with the availability of new technologies and the demand for new applications, so do the challenges associated with robust ESD design. These challenges manifest themselves in a multitude of perspectives, including ESDmodeling, characterization, and design. To address each of the aforementioned issues, we have selected three invited papers that are extensions of original works presented at the 2012 EOS/ESD Symposium. The three papers are briefly summarized.
Keywords :
Circuit simulation; Electrostatic devices; Electrostatic discharges; High-voltage techniques; Special issues and sections;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2013.2264734