• DocumentCode
    1761231
  • Title

    Foreword for the Special Section on ESD Modeling, Characterization, and Design

  • Author

    Boselli, G.

  • Author_Institution
    Texas Instruments, Dallas , TX, USA
  • Volume
    13
  • Issue
    2
  • fYear
    2013
  • fDate
    41426
  • Firstpage
    370
  • Lastpage
    370
  • Abstract
    As the complexity of ESD design keeps increasing with the availability of new technologies and the demand for new applications, so do the challenges associated with robust ESD design. These challenges manifest themselves in a multitude of perspectives, including ESDmodeling, characterization, and design. To address each of the aforementioned issues, we have selected three invited papers that are extensions of original works presented at the 2012 EOS/ESD Symposium. The three papers are briefly summarized.
  • Keywords
    Circuit simulation; Electrostatic devices; Electrostatic discharges; High-voltage techniques; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2013.2264734
  • Filename
    6527996