DocumentCode
1761231
Title
Foreword for the Special Section on ESD Modeling, Characterization, and Design
Author
Boselli, G.
Author_Institution
Texas Instruments, Dallas , TX, USA
Volume
13
Issue
2
fYear
2013
fDate
41426
Firstpage
370
Lastpage
370
Abstract
As the complexity of ESD design keeps increasing with the availability of new technologies and the demand for new applications, so do the challenges associated with robust ESD design. These challenges manifest themselves in a multitude of perspectives, including ESDmodeling, characterization, and design. To address each of the aforementioned issues, we have selected three invited papers that are extensions of original works presented at the 2012 EOS/ESD Symposium. The three papers are briefly summarized.
Keywords
Circuit simulation; Electrostatic devices; Electrostatic discharges; High-voltage techniques; Special issues and sections;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2013.2264734
Filename
6527996
Link To Document