• DocumentCode
    1761392
  • Title

    Mixed-Mode Analysis of Different Mode Silicon Nanowire Transistors-Based Inverter

  • Author

    Juncheng Wang ; Gang Du ; Kangliang Wei ; Kai Zhao ; Lang Zeng ; Xing Zhang ; Xiaoyan Liu

  • Author_Institution
    Key Lab. of Microelectron. Devices & Circuits, Peking Univ., Beijing, China
  • Volume
    13
  • Issue
    2
  • fYear
    2014
  • fDate
    41699
  • Firstpage
    362
  • Lastpage
    367
  • Abstract
    In this paper, we focused on the comparison and analysis of the performance of inversion-mode (IM), accumulation-mode (AM), and junctionless (JL) silicon nanowire field-effect transistors (NWTs)-based inverter. The effects of the radius, equivalent oxide thickness and source/drain doping in the different mode nanowire device structure are investigated. The capacitance components and transient characteristics, which determine the behavior of devices in the circuits, are studied and compared among different mode nanowire devices. The mixed-mode circuit simulations have been performed for the inverter circuit and three-stage ring oscillator consist of n-type and p-type IM/AM/JL NWTs. JL NWTs show lower Miller capacitance which contributes to suppressing the overshoot effect in the circuits. Results of these simulations can give insights into the in-circuit behavior of these future generation devices.
  • Keywords
    elemental semiconductors; field effect transistors; invertors; nanowires; oscillators; semiconductor doping; silicon; Si; accumulation-mode silicon nanowire field-effect transistor-based inverter; capacitance component; different mode nanowire device structure; different mode silicon nanowire transistors-based inverter; inversion-mode silicon nanowire field-effect transistor-based inverter; junctionless silicon nanowire field-effect transistor-based inverter; lower Miller capacitance; mixed-mode circuit simulation analysis; n-type IM-AM-JL NWT; overshoot effect suppression; p-type IM-AM-JL NWT; radius equivalent oxide thickness; source-drain doping; three-stage ring oscillator; transient characteristics; Capacitance; Doping; Integrated circuit modeling; Inverters; Licenses; Logic gates; Silicon; Junctionless (JL); mixed-mode circuit simulation; nanowire; transistor;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2014.2305577
  • Filename
    6736109