DocumentCode :
1761413
Title :
Analysis, Design, Modeling, and Characterization of Low-Loss Scalable On-Chip Transformers
Author :
Tiemeijer, Luuk F. ; Pijper, Ralf M. T. ; Andrei, Cristian ; Grenados, E.
Author_Institution :
NXP Central R&D, Eindhoven, Netherlands
Volume :
61
Issue :
7
fYear :
2013
fDate :
41456
Firstpage :
2545
Lastpage :
2557
Abstract :
A few important design choices for a low-loss scalable on-chip transformer are discussed, the most important one being that the capacitive and inductive couplings should be aligned to minimize insertion loss. The importance of these design choices is illustrated both theoretically as well as experimentally. In particular, for the first time the performance of these on-chip transformers is verified with four-port S -parameter measurements taken up to 67 GHz. With that, an insertion loss of only 0.6 dB up to 30 GHz is demonstrated. To facilitate the use of these low-loss on-chip transformers in the RF integrated-circuit design flow, a scalable compact equivalent-circuit model suitable for all pre-layout circuit simulations is described, which accurately predicts transformation ratios, transmission efficiencies and balun amplitude and phase imbalances.
Keywords :
S-parameters; equivalent circuits; integrated circuit design; radiofrequency integrated circuits; transformers; RF integrated-circuit design flow; balun amplitude; capacitive-inductive couplings; four-port S -parameter measurements; insertion loss; low-loss scalable on-chip transformer analysis; low-loss scalable on-chip transformer characterization; low-loss scalable on-chip transformer design; low-loss scalable on-chip transformer modeling; phase imbalances; pre-layout circuit simulations; scalable compact equivalent-circuit model; transformation ratios; transmission efficiencies; Calibration; de-embedding; on-wafer microwave measurements; transformer design and modeling;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2013.2265684
Filename :
6528020
Link To Document :
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