Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation

Author

Chihyun Cho ; Joo-Gwang Lee ; Jeong-Hwan Kim ; Dae-Chan Kim

Author_Institution

Div. of Phys. Metrol., Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea

Volume

64

Issue

6

fYear

2015

fDate

42156

Firstpage

1413

Lastpage

1418

Abstract

This paper proposes an error vector magnitude (EVM) measurement method for a wideband code-division multiple-access source using a real-time oscilloscope. The EVM values are extracted from the measured waveform using a signal processing that finds the appropriate carrier phase and symbol timing. Measurement uncertainty is also evaluated based on a Monte Carlo simulation, where the errors from the real-time oscilloscope and the signal processing are taken into account. The measured EVM of a source at 900 MHz is (0.2586 ± 0.0040)%, (0.2617 ± 0.0060)%, and (0.2543 ± 0.0078)% at 95% confidence level when the real-time oscilloscope has a bandwidth of 2, 4, and 20 GHz, respectively.

Keywords

Monte Carlo methods; code division multiple access; electric variables measurement; measurement errors; measurement uncertainty; oscilloscopes; signal processing; EVM measurement uncertainty; Monte Carlo simulation; bandwidth 2 GHz; bandwidth 20 GHz; bandwidth 4 GHz; carrier phase; error vector magnitude; frequency 900 MHz; measurement errors; real-time oscilloscope; signal processing; symbol timing; wideband code division multiple access source; Jitter; Measurement uncertainty; Monte Carlo methods; Noise; Timing; Uncertainty; Code division multiplexing; digital modulation; error vector magnitude (EVM); measurement uncertainty; phase-shift keying; phase-shift keying.;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2015.2406058

Filename

7058368