Title :
Low-Power High-Throughput LDPC Decoder Using Non-Refresh Embedded DRAM
Author :
Youn Sung Park ; Blaauw, D. ; Sylvester, Dennis ; Zhengya Zhang
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
The majority of the power consumption of a high-throughput LDPC decoder is spent on memory. Unlike in a general-purpose processor, the memory access in an LDPC decoder is deterministic and the access window is short. We take advantage of the unique memory access characteristic to design a non-refresh eDRAM that holds data for the necessary access window, and further improve its access time by trading off the excess retention time. The resulting 3T eDRAM cell is designed to balance wordline coupling to reliably retain data for a fast access. We integrate 32 5x210 non-refresh eDRAM arrays in a row-parallel LDPC decoder suitable for the IEEE 802.11ad standard. Memory refresh is eliminated and random access is replaced with a simple sequential addressing. With row merging and dual-frame processing, the 1.6 mm 2 65 nm LDPC decoder chip achieves a peak throughput of 9 Gb/s at 89.5 pJ/b, of which only 21% is spent on eDRAMs. With voltage and frequency scaling, the power consumption of the LDPC decoder is reduced to 37.7 mW for a 1.5 Gb/s throughput at 35.6 pJ/b.
Keywords :
DRAM chips; integrated circuit design; parity check codes; 3T eDRAM cell; IEEE 802.11ad standard; access time; access window; bit rate 1.5 Gbit/s; bit rate 9 Gbit/s; dual-frame processing; excess retention time; frequency scaling; general-purpose processor; low-power high-throughput LDPC decoder; memory access characteristic; memory refresh elimination; nonrefresh eDRAM arrays; nonrefresh eDRAM design; nonrefresh embedded DRAM; power 37.7 mW; power consumption; random access; row merging; row-parallel LDPC decoder; sequential addressing; voltage scaling; wordline coupling; Clocks; Decoding; Memory management; Merging; Parity check codes; Throughput; Embedded DRAM; LDPC code; LDPC decoder architecture; low-power DSP design;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2014.2300417