DocumentCode :
1761528
Title :
Comparison of AWGs and Echelle Gratings for Wavelength Division Multiplexing on Silicon-on-Insulator
Author :
Pathak, Sant ; Dumon, P. ; Van Thourhout, Dries ; Bogaerts, W.
Author_Institution :
Dept. of Inf. Technol., IMEC, Ghent Univ., Ghent, Belgium
Volume :
6
Issue :
5
fYear :
2014
fDate :
Oct. 2014
Firstpage :
1
Lastpage :
9
Abstract :
We compare the performance (insertion loss and crosstalk) of silicon-based arrayed waveguide gratings (AWGs) and echelle gratings for different channel spacings. For high-resolution de/multiplexer (DWDM) applications, AWGs are the better choice, whereas echelle gratings perform well for low-resolution de/multiplexer (CWDM) applications. Alternatively, for low-resolution de/multiplexer applications, the conventional box-shaped silicon AWG can be modified by an S-shaped AWG. We report crosstalk as low as -27 dB for regular AWGs, whereas in the S-shaped AWGs, the crosstalk is better than -19 dB, with an insertion loss below -2 dB. The crosstalk of the echelle gratings varies between -19 and -23 dB, with insertion loss below -2 dB.
Keywords :
arrayed waveguide gratings; demultiplexing; diffraction gratings; optical crosstalk; optical losses; silicon-on-insulator; wavelength division multiplexing; S-shaped AWG; Si; arrayed waveguide gratings; channel spacings; crosstalk; echelle gratings; high-resolution de/multiplexer applications; insertion loss; low-resolution de/multiplexer applications; silicon-on-insulator; wavelength division multiplexing; Arrayed waveguide gratings; Arrays; Channel spacing; Crosstalk; Delays; Gratings; AWG;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2014.2361658
Filename :
6916984
Link To Document :
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