DocumentCode :
1761689
Title :
A 12-bit 40 nm DAC Achieving SFDR > 70 dB at 1.6 GS/s and IMD < –61dB at 2.8 GS/s With DEMDRZ Technique
Author :
Wei-Te Lin ; Hung-Yi Huang ; Tai-Haur Kuo
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
49
Issue :
3
fYear :
2014
fDate :
41699
Firstpage :
708
Lastpage :
717
Abstract :
For current-steering digital-to-analog converters (DACs), a technique utilizing dynamic-element-matching and digital return-to-zero, called DEMDRZ, is proposed to simultaneously suppress the mismatch- and transient-induced nonlinearity. In doing so, the usage of small-sized current sources and switches is possible, and the spurious-free dynamic range (SFDR) and intermodulation distortion (IMD) for high signal frequencies can be improved. With the DEMDRZ technique, a 12-bit compact, low-power, high-speed, high-resolution DAC is implemented in TSMC 40 nm CMOS process. The DAC architecture, circuit, and layout designs are presented. The implemented DAC achieves 70 dB SFDR for signals over the 800 MHz Nyquist bandwidth at 1.6 GS/s and <; -61 dB IMD for signals over the 1.4 GHz Nyquist bandwidth at 2.8 GS/s. Further, it dissipates 40 mW with a single 1.2 V supply. The active area of the DAC is 0.016 mm 2 , which is less than 6% of other state-of-the-art 12-bit current steering DACs. Furthermore, the implemented DAC performs best with three common figure-of-merits (FoMs).
Keywords :
CMOS digital integrated circuits; constant current sources; digital-analogue conversion; integrated circuit layout; intermodulation distortion; low-power electronics; CMOS process; DAC architecture; DEMDRZ technique; FoM; IMD; Nyquist bandwidth; SFDR; circuit design; current steering DAC; current-steering digital-to-analog converters; digital return-to-zero technique; dynamic-element-matching technique; figure-of-merits; high-resolution DAC; high-signal frequencies; high-speed DAC; intermodulation distortion; layout design; low-power DAC; mismatch-induced nonlinearity suppression; power 40 mW; size 40 nm; small-sized current sources; spurious-free dynamic range; switches; transient-induced nonlinearity suppression; voltage 1.2 V; word length 12 bit; Bandwidth; Impedance; Layout; Optical signal processing; Parasitic capacitance; Switches; Transistors; Compact size; DAC; DEM; DRZ; FoM; IMD; RTZ; SFDR; current-steering; digital return-to-zero; digital-to-analog converter; dynamic element matching; figure-of-merit; high-resolution; high-speed; intermodulation distortion; mismatch insensitivity; return-to-zero; spurious-free dynamic range;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2301769
Filename :
6736139
Link To Document :
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